Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from
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intensity -only measurements under diverse illumination. We evaluate the forward and inverse scattering model based on the first Born approximation for imaging scattering objects above a glass slide. Under this design, the measured field combineslinear forward-scattering and height-dependentnonlinear back-scattering from the object that complicates object phase recovery. Using only the forward-scattering, we derive a linear inverse scattering model and evaluate this model’s validity range in simulation and experiment using a standard reflection microscope modified with a programmable light source. Our method provides enhanced contrast of thin, weakly scattering samples that complement transmission techniques. This model provides a promising development for creating simplified intensity-based reflection quantitative phase imaging systems easily adoptable for biological research. -
Sentenac, Anne ; Mertz, Jerome ( , Journal of the Optical Society of America A)
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Shain, William J. ; Vickers, Nicholas A. ; Negash, Awoke ; Bifano, Thomas ; Sentenac, Anne ; Mertz, Jerome ( , Optics Letters)